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High Performance
● Atomic-scale of resolution
● Large sample size
● With a DSP inside for great performance
● Realtime operating system embedded
● Fast Ethernet connection with computer
Multi-function
● Atomic Force Microscope (AFM)
● Scanning Tunneling Microscope (STM)
● Lateral Force Microscope (LFM)
● Force Analysis: I-V Curve, I-Z Curve, Force Curve
● Online real-time 3D image for better observation
● Multi-channel signals for more sample details
● Trace-Retrace scan, Back-Forward scan
● Multi-Analysis: Granularity and Roughness
● Data load-out for further analysis
Easy Operation
● Fast automatically tip-engaging
● Simple change the tipholder to switch between STM and AFM
● Full digital control, auto system status recognition
● Software-based sample movement
● Nano-Movie function: Continuous data collection, storage and replay
● Modularized design for convenience of maintenance and future upgrade
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