BY Series SPM


 BY Series SPM


  BY2000 Atomic Force Microscope AFM
  BY3000 Scanning Probe Microscope SPM

High Performance, Low Price  



High Performance


● Atomic-scale of resolution


● Large sample size


● With a DSP inside for great performance


● Realtime operating system embedded


● Fast Ethernet connection with computer 




● Atomic Force Microscope (AFM)


● Scanning Tunneling Microscope (STM)


● Lateral Force Microscope (LFM)


● Force Analysis: I-V Curve, I-Z Curve, Force Curve


● Online real-time 3D image for better observation


● Multi-channel signals for more sample details


● Trace-Retrace scan, Back-Forward scan


● Multi-Analysis: Granularity and Roughness


● Data load-out for further analysis





Easy Operation


● Fast automatically tip-engaging


● Simple change the tipholder to switch between STM and AFM


● Full digital control, auto system status recognition


● Software-based sample movement


● Nano-Movie function: Continuous data collection, storage and replay


● Modularized design for convenience of maintenance and future upgrade



  BY Series Brochure in English